Metrics for Benchmarking scRNA-Seq Batch Correction
Overview
Evaluate batch effect correction algorithms for scRNA-seq using multiple established methods, including the Adjusted Rand Index, Normalized Mutual Information, Local Inverse Simpson Index, and Silhouette Width. Methods for aggregating and weighing multiple metrics together are also included. For further explanation of methods, see Swamy et al. (2021)doi:10.1101/2021.03.26.437190 .
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- Help pages
- 10includes a package overview page
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- 86%6 run in a plain check · 1 only when donttest examples are enabled (R CMD check --as-cran)
- Exported functions with examples
- 86%
- Documented parameters
- 100%
- Return-value docs
- 100%
- Help pages citing references
- 0%
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People & History
- RR 4.3.0 released · 2023-04-21
- archivedRemoved from CRAN2022-12-05issues were not corrected despite reminders
- RR 4.2.0 released · 2022-04-22
- 0.1.02021-08-04
- RR 4.1.0 released · 2021-05-18
Package metadata
- First published
- 2021-08-04
- Total releases
- 1 / 5 yrs
- License
- GPL-3 OSI
- Minimum R
- ≥ 2.10
- Bundled data
- 657 KB / 1 file
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