Description
Take real or simulated data and salt it with errors commonly found in the wild, such as pseudo-OCR errors, Unicode problems, numeric fields with nonsensical punctuation, bad dates, etc.
Downloads
231
Last 30 days
21471st
555
Last 90 days
2.4K
Last year
Trend: +68.6% (30d vs prior 30d)
0
Last 30 days
24
Last 90 days
107
Last year
Trend: -100% (30d vs prior 30d)
2
Last 7 days
7
Last 30 days
0
All-time
autoCRAN-only: this name is served only by autoCRAN, so the count is exact.
CRAN Check Status
Show all 13 flavors
| Flavor | Status |
|---|---|
| r-devel-linux-x86_64-debian-clang | OK |
| r-devel-linux-x86_64-debian-gcc | OK |
| r-devel-linux-x86_64-fedora-clang | OK |
| r-devel-linux-x86_64-fedora-gcc | OK |
| r-devel-windows-x86_64 | OK |
| r-oldrel-macos-arm64 | OK |
| r-oldrel-macos-x86_64 | OK |
| r-oldrel-windows-x86_64 | OK |
| r-patched-linux-x86_64 | OK |
| r-release-linux-x86_64 | OK |
| r-release-macos-arm64 | OK |
| r-release-macos-x86_64 | OK |
| r-release-windows-x86_64 | OK |
Check History
OK 14 OK · 0 NOTE · 0 WARNING · 0 ERROR · 0 FAILURE Mar 10, 2026
Code
Structure
Lines of code
1,188
Files
38
Compiled share
0%
Has compiled src
No
Language breakdown
API
Exported functions
18
Internal functions
7
Recent export changes
Testing & CI
Has tests
Yes
Test-to-code ratio
0.42
testthat edition
–
CI present
No
CI type
[]
PR gated
No
Docs
Return-value doc rate
88.9%
\dontrun example ratio
0%
Roxygen coverage
100%
Has pkgdown
No
NEWS present
Yes
Health & Security signals
Informational signals; not verdicts.
on.exit coverage
–
Unsafe pattern score
0
Dep constraint coverage
0%
Secret pattern count
0
Bundled 3rd-party code
2 items
Portability & License
Min R version
2.10
System requirements
–
C++ standard
–
License
MIT + file LICENSE
License flags
SPDX valid, OSI approved
History
Versions
3
First release
2018-09-17
Latest release
2025-11-28
Avg cadence
1315 days
Cold removal rate
–
Dep drift
0
LOC over versions
Per-file churn detail lives in the source pipeline: https://github.com/r-observatory/cran-code-metrics.